Designer's guide to built-in self-test
Material type:
TextLanguage: English Series: Frontiers in electronic testingPublication details: Boston Kluwer Academic 2002Description: xvi,319pISBN: - 1-4020-7050-0
- 621.395 St925
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|
| Books | ISI Library, Kolkata | 621.395 St925 (Browse shelf(Opens below)) | Available | 124441 |
Total holds: 0
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| 621.395 Sh546 Statistical performance analysis and modeling techniques for nanometer VLSI designs / | 621.395 St786 Spectral interpretation of decision diagrams | 621.395 St924 Priori wire length estimates for digital design | 621.395 St925 Designer's guide to built-in self-test | 621.395 T514 Spectral techniques in VLSI CAD | 621.395 W246 VLSI Test principles and architectures | 621.395 W855 FPGA -based system design |
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