Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.
Material type:
- 9781461407874 (hbk.)
- 1461407877 (hbk.)
- 621.395 Sh546
- TK7874.75 .S475 2012
Item type | Current library | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|
Books | ISI Library, Kolkata | 621.395 Sh546 (Browse shelf(Opens below)) | Available | 134857 |
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621.395 Sa247 Modern placement techniques | 621.395 Sa272 Routing congestion in VLSI circuits | 621.395 Se453 Reuse techniques for VLSI design | 621.395 Sh546 Statistical performance analysis and modeling techniques for nanometer VLSI designs / | 621.395 St786 Spectral interpretation of decision diagrams | 621.395 St924 Priori wire length estimates for digital design | 621.395 St925 Designer's guide to built-in self-test |
Includes bibliographical references (pages 287-297) and index.
Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.
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