Online Public Access Catalogue (OPAC)
Library,Documentation and Information Science Division

“A research journal serves that narrow

borderland which separates the known from the unknown”

-P.C.Mahalanobis


Image from Google Jackets

Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.

By: Contributor(s): Material type: TextTextDescription: xxix, 305 pages : illustrations ; 25 cmISBN:
  • 9781461407874 (hbk.)
  • 1461407877 (hbk.)
Subject(s): DDC classification:
  • 621.395 Sh546
LOC classification:
  • TK7874.75 .S475 2012
Contents:
Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.
Tags from this library: No tags from this library for this title. Log in to add tags.

Includes bibliographical references (pages 287-297) and index.

Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.

There are no comments on this title.

to post a comment.
Library, Documentation and Information Science Division, Indian Statistical Institute, 203 B T Road, Kolkata 700108, INDIA
Phone no. 91-33-2575 2100, Fax no. 91-33-2578 1412, ksatpathy@isical.ac.in