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Optimum accelerated life testing models with time-varying stresses / Preeti Wanti Srivastava.

By: Material type: TextTextPublication details: Singaopre : World Scientific, ©2017.Description: xxxviii, 405 pages : illustrations ; 24 cmISBN:
  • 9789813141254 (hc : alk. paper)
Subject(s): DDC classification:
  • 620.0044 23 Sr774
Contents:
1. Different aspects of ALT models -- 2. Optimum step-stress accelerated life test models -- 3. Optimum step-stress partially accelerated life test plans with type-I and type-II censoring -- 4. Optimum ramp-stress fully accelerated life test plans under type-I -- 5. Optimum fully accelerated life test plans with modified stress loading schemes under type-I censoring -- 6. Optimum time-censored step-stress fully ALT with competing risks for failure -- 7. Product control and accelerated life testing -- 8. Optimum time-censored ramp-stress ALTSP -- 9. Optimum time-censored step-stress PALTSP with warranty using tampered failure rate model -- 10. Optimum time-censored step-stress PALTSP with competing causes of failure using tampered failure rate model -- Appendices.
Summary: This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Books ISI Library, Kolkata 620.0044 Sr774 (Browse shelf(Opens below)) Available 138010
Total holds: 0

Includes bibliographical references and index.

1. Different aspects of ALT models --
2. Optimum step-stress accelerated life test models --
3. Optimum step-stress partially accelerated life test plans with type-I and type-II censoring --
4. Optimum ramp-stress fully accelerated life test plans under type-I --
5. Optimum fully accelerated life test plans with modified stress loading schemes under type-I censoring --
6. Optimum time-censored step-stress fully ALT with competing risks for failure --
7. Product control and accelerated life testing --
8. Optimum time-censored ramp-stress ALTSP --
9. Optimum time-censored step-stress PALTSP with warranty using tampered failure rate model --
10. Optimum time-censored step-stress PALTSP with competing causes of failure using tampered failure rate model --
Appendices.

This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.

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