TY  - BOOK
AU  - Bushnell Michael L
AU  - Agrawal Vishwani D
TI  - Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
SN  - 0-7923-799-1-8
U1  - 621.395 
PY  - 2000///
CY  - Boston
PB  - Kluwer Academic
KW  - Digital integrated circuits-testing
KW  - Integrated circuits-testing
KW  - Mixed signal circuits-testing
KW  - Semiconductor storage devices-testing
KW  - Very large scale integration
ER  -