TY  - BOOK
AU  - Nicolici Nicola
AU  - Al-Hashimi Bashir M
TI  - Power constrained testing of VLSI circuits
SN  - 1-4020-7235-X
U1  - 621.395 
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic
KW  - Electronic testing
KW  - VLSI circuits
ER  -