TY  - BOOK
AU  - Krstic Angela
AU  - Cheng Kwang-Ting (Tim)
TI  - Delay fault testing for VLSI Circuits
SN  - 0-7923-8295-1
U1  - 621.395 
PY  - 1998///
CY  - Boston
PB  - Kluwer Academic
KW  - Delay faults(Semiconductors)
KW  - Very large scale integration
KW  - VLSI circuits
ER  -