TY  - BOOK
AU  - Wang Laung-Terng
AU  - Wen Xiaoqing
AU  - Wu Cheng-Wen
TI  - VLSI Test principles and architectures: design for testability
SN  - 0-12-370597-5
U1  - 621.395 
PY  - 2006///
CY  - Amsterdam
PB  - Morgan Kaufmann
KW  - Integrated circuits-Very large scale integration-design
KW  - Integrated circuits-Very large scale integration-testing
ER  -