Statistical performance analysis and modeling techniques for nanometer VLSI designs - Shen, Ruijing; Tan, Sheldon X. D.; Yu, Hao. (2012)
Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.
Includes bibliographical references (pages 287-297) and index.
Keywords: Integrated circuits -- Very large scale integration -- Computer-aided design; Integrated circuits -- Very large scale integration -- Statistical methods; Nanoelectronics -- Statistical methods; Algorithms