TY  - BOOK
AU  - Shen,Ruijing
AU  - Tan,Sheldon X.D.
AU  - Yu,Hao
TI  - Statistical performance analysis and modeling techniques for nanometer VLSI designs
SN  - 9781461407874 (hbk.)
AV  - TK7874.75 .S475  2012
U1  - 621.395 
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Computer-aided design
KW  - Statistical methods
KW  - Nanoelectronics
KW  - Algorithms
N1  - Includes bibliographical references (pages 287-297) and index; Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method --  Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization
ER  -