000 00421nam a2200157Ia 4500
008 131223s9999 xx 000 0 und d
040 _aISI KOLKATA
041 _aEnglish
082 _a621.38173
_bR334
100 _aReghbati H K
245 _aVLSI
_btesting and validation techniques
260 _aWashington D C
_bIEEE Computer Society Press
_c1985
300 _aix,603p.
650 _aElectronic circuits
942 _cBK
999 _c6015
_d6015