000 00480nam a2200181Ia 4500
008 131223s9999 xx 000 0 und d
020 _a0-471-31931-7
040 _aISI KOLKATA
041 _aEnglish
082 _a621.381548
_bM929
100 _aMourad Samiha
245 _aPrinciples of testing electronic systems
260 _aNew York
_bJohn Wiley
_c2000
300 _axix,420p.
650 _aElectronic circuits-testing
700 _aZorian Yervant
_4Auth.
942 _cBK
999 _c99199
_d99199