000 00535nam a2200205Ia 4500
008 131223s9999 xx 000 0 und d
020 _a0-521-77356-3
040 _aISI KOLKATA
041 _aEnglish
082 _a621.381548
_bJ59
100 _aJha N K
245 _aTesting of digital systems
260 _aCambridge
_bCUP
_c2003
300 _axvi,1000p.
650 _aDigital circuits-testing
650 _aElectronic circuits-testing
650 _aSemiconductor circuits-testing
700 _aGupta S
_4Auth.
942 _cBK
999 _c99200
_d99200